The XRD-XRF Portable Spectrometer by XGLAB Bruker Nano Analytics Division combines X-ray fluorescence (XRF) and X-ray diffraction (XRD) technologies into a compact, portable system designed for fast, non-destructive, and non-invasive point analysis. Equipped with advanced detectors and intuitive software, the spectrometer delivers detailed elemental and structural insights directly on-site. Its versatile design allows operation on a table or tripod, ensuring easy positioning for different applications in archaeometry, conservation, and materials science, excelling in analysing manuscripts, ceramics, metals, paintings, marbles, and more.
The XRD-XRF portable spectrometer by XGLAB Bruker Nano Analytics Division combines X-ray fluorescence and X-ray diffraction measurement in a single instrument. It can be operated either mounted on feet for table operation or mounted on a tripod with the provided mechanics for easy and versatile positioning. This compact system has been designed for in situ, fast, non-destructive and non-invasive analysis on different classes of objects, like manuscripts, metals, ceramic or glass objects, paintings and marbles. The system is equipped with a large area SDD for XRF and a high-performance hybrid pixel detector (XPAD) for XRD. The system comes with a complete software suite that allows to operate the instrumentation safely and remotely.
Activity should be performed following the local rules ofor radioprotection. Permissions must be granted by the user before starting the activity. For paintings, thick varnishes may affect the quality of XRD data so it is recommended to verify that the artwork does have a thin varnish/to carry out the analysis following varnish removal if the object is under conservation treatment.