XRD-XRF

Combined XRF-XRD spectrometers are advanced analytical instruments that integrate X-ray fluorescence (XRF) and X-ray diffraction (XRD) technologies into a single system, offering unparalleled versatility in material characterization. XRF provides elemental composition by detecting characteristic X-ray emissions from a sample, while XRD determines crystalline structures by analyzing the diffraction patterns of X-rays scattered by the sample's atomic lattice. By combining these techniques, a single instrument can deliver comprehensive insights into both the chemical and structural properties of materials, making it invaluable in fields such as archaeometry, conservation and materials science. This synergy reduces analysis time, minimizes sample handling, and enhances data accuracy, streamlining workflows and enabling more detailed investigations.

Hyphenate xrd/xrf

Non invasive

1.0