Description
The XRD-XRF portable spectrometer (XRD-XRF) consists of a spectrometric head equipped with a low power microfocus X-ray tube (30W) with a copper anode coupled to a focusing polycapillary lens. The primary X-ray beam hits the sample with an angle of about 10°. The spot of the beam coming out from the primary X-ray source has dimension up to 4.6 mm, and it is reduced to 0.075, 0.1, 0.22, 0.5 or 1 mm depending on the different collimating slit that can be mounted on the optics. The XRF detection system consists of a silicon drift detector with 50 mm2 active area and <140 eV energy resolution for Mn Kα line (5.890 keV). The working distance between the XRF detector and the sample is typically in the range of 20-24 mm, while the minimum distance of the whole instrument from the sample plane is about 9 mm. The XRD detection system is an XPAD detector working in the 7-35 energy range, with silicon as sensor material, which covers an active area of 7.5x1.25 cm2, with pixel size of 130x130 µm2 and total pixel number of 67200 (560x120). Different lasers (axial and focal with independent control) pointing to the sample and a monitoring microscope camera (field of view 30x25 mm2) with LED illumination allow to properly align the instrument in front of the sample. Two additional lasers are present for better orthogonal alignment of the incident X-ray beam. A compact control unit (CPU), which includes a high voltage generator, is part of the system. The CPU is used for controlling the operational parameters of the scanner and to visualize spectra and provide real-time elemental information and diffraction patterns to be analysed for the mineralogical composition of the sample. The system can be used for point analysis, allowing fast, high-resolution multielement analysis from Al to U.
Output and data types
Image/Figure
Dataset
Dataset/Data package (images, spectra, other)
XRD pattern in .txt file
XRD/XRF project file