Method: VIS-NIR Hyperspectral Imaging Dynamic Monitoring of Reflectance Alterations
Organization
Alternative labels
spectral imaging
hyperspectral imaging
hyperspectral imaging
Description
The VIS-NIR hyperspectral imaging system can be used in a stationary modality (that is without spatial scanning) to carry out time resolved reflectance spectroscopy to monitor and control the possible alteration induced by intense radiations, such as optical lasers, X-rays and ion beams. Any change in VIS-NIR (400-900 nm) reflectance (ΔR) is the result of changes in absorption and/or scattering of the material surface under investigation, hence ΔR can provide an indication of both chemical and physical changes of the surface. Moreover, the intrinsically high sensitivity of the VIS-NIR reflectance spectroscopy technique enables the detection of even subtle material changes which are not detectable by other techniques.
Techniques
Other
Other techniques
VIS/NIR reflectance spectral imaging
Type
Analysis Method & Data Processing
Version
1
Parameters
Type: spectral resolution
Unit: nm
Value: 2.8
Type: wavelength range
Unit: nm
Value: 400-1000