The Scanning Electron Microscope (SEM) is a non-contact, non-destructive tool used for qualitative and quantitative analysis of material composition. During examination, a focused electron beam excites the sample surface, generating electrons and photons through electron-material interactions. These electrons and photons are detected. The processed data enables quantitative and qualitative chemical examinations at very high magnification (up to 50,000 magnification), and element maps can also be created. Additionally, SEM can produce high-resolution, high-depth-of-field images of diverse materials, including ceramics, metal objects, plants, bones, textiles, polymers, pigments, glasses, geological specimens, and industrial materials. From these images, complex granulometric analyses can also be performed. Specification: Measurement atmosphere: High Vacuum (10-5 Pa), Low Vacuum (10-650 Pa) Acceleration speed: 0.5 kV- 30 kV Cathode material: W Beam current: 1 pA- 1 µA Measurement options: measuring of point, area, line; element mappings; live point and mapping analysis; phase analysis; granulometry Stage moving: 125 mm x 100 mm Maximum sample size: 203 mm x 203 mm x 80 mm Detectors: JEOL Secondary Electron Detector (SE) JEOL Photo Detector (PD) JEOL Back Scattered Electron Detector (BSE) JEOL Energy Dispersive Spectrometer (EDS) Bruker Quantax Esprit Core XFlash®7 Energy Dispersive Spectrometer (EDS) Bruker Quantax Wavelength Dispersive Spectrometer (WDS) Horiba Flex-CLUE Cathodoluminescence Spectrometer (CL)

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Noncontact (no physical contact)
Nondestructive (no permanent damage or alteration)

JEOL

JSM-IT510/LA

125 mm x 100 mm