The micro-XRF spectroscope (XRF: X-ray fluorescence) is a non-contact, non-destructive tool for qualitative and quantitative material composition analysis. It can be used on various materials, including ceramics, stone tools, metal objects, plants, bones, tissues, polymers, pigments, glasses, geological samples, and industrial materials. Measurements can be conducted with 200 µm or 20 µm diameter measurement points, enabling point measurements, line scans, area analyses, and 2D element mapping. With its high excitation power, the spectroscope can extract compositional information from depths of up to several hundred micrometers, and it is also capable of trace element analysis. Specifications Measurement atmosphere: Air, or vacuum (up to 2 mbar) Sample types: solids, particles, liquids Detectors: Two XFlash® silicon drift detectors with 60 mm2 detector area, detection from C to Am Excitation: Rh anode, 50kV, 600µA, 200 µm or 20 µm spot size; W anode, 50 kV 700 µA, 0,5 mm, 1 mm, 2 mm, 4,5 mm spot size Stage moving: 200 x 160 x 120 mm3

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Dataset/Data package (images, spectra, other)
Report
spectra in *.csv

Noncontact (no physical contact)
Nondestructive (no permanent damage or alteration)
Noninvasive (no physical alteration)

Bruker

M4 Tornado Plus AMICS

200 x 160 mm