The Bruker M4 TORNADO micro-XRF (XRF: X-ray fluorescence) spectrometer is applied for the non-destructive analysis of art and archaeological objects but can be used for other types of samples as well. It yields information on the concentration and distribution of elements from the surface of the sample. The device complements the accelerator based techniques traditionally applied in ATOMKI for elemental analysis, depending on the sample and the analytical problem one or the other is the optimal choice. Point measurements, line scans and mapping analyses can be performed in air or in 20 mbar vacuum. There are two X-ray tubes for he excitation: Rh anode focused to 20 µm with built-in policapillary lenses and a W anode with a spot size collimated to 1 mm. Two XFlash® silicon drift detectors with 30 mm2 detector area provide the detection of elements from Na to U. The relatively large sample chamber allows the investigation of archaeological samples.

Image
Dataset
Dataset/2D
Report
data interpretation
XRF spectra in .spe file
spectra
quantitative
qualitative
point, line and area scans

Noncontact (no physical contact)

Bruker

M4 Tornado

micro
10 x 10 cm 2