In scanning electron microscopy, the principle of imaging is to map the surface of an object not simultaneously but continuously from point to point by a beam of electrons focused on a tiny section of the sample and detecting the reflected electrons. The scanning electron microscope (SEM) of the Heritage Science Laboratory is suitable for imaging with a secondary electron, backscattered electron, a cathode luminescent detector, Raman detector as well as for determining the elemental composition with an EDS detector. Unlike conventional SEM devices, where only conductive surfaces can be analized, this instrument is suitable for measuring insulating samples even without pre-applied gold or carbon coating on their surface thanks to the low vacuum mode available in the instrument. In the case of archaeological specimens, it can provide important information regarding the surface as well as the elemental composition.

Image
Image/Figure
Dataset
Report
quantitative and qualitative chemical data
EDS spectra

Noncontact (no physical contact)
Nondestructive (no permanent damage or alteration)

Jeol

JSM-IT500HR

125 mm x 100 mm