Description
The TOF-ND instrument is a general purpose high resolution time-of-flight powder diffractometer. It covers a d-spacing range from 0.5 to 2.5Å (2.5 to 12.5 Å-1 in Q-range) at variable band-with and resolution (d=0.0015–0.15Å). It is applicable for structure determination and refinement, peak profile analyses, phase and texture analyses of solid state materials and for liquid diffraction as well. TOF provides information of the fine phase changes inside the materials, without producing any type of destruction in the sample.
The instrument is installed at a radial thermal neutron beam. A double disk chopper (Ch1 and Ch2) is used to produce very short pulses at high speed. The instrument is recently equipped with a large surface back-scattering detector bank. It covers 20° scattering angle (2=145°–165°). The data are collected in the so called event recording mode: all events on the detector, the chopper signals and optionally changes in the sample environment are registered versus time. If this mode is used, many uncertainties can be filtered out during the data treatment, allow to perform time-dependent in-situ experiments in a single measurement.