Tool: Spatially Offset Raman Spectroscopy @ 785 nm
Organization
Nottingham Trent University ISAAC Research Lab
Last checked date
09-12-2024
Description
The Spatially Offset Raman Spectrometer utilises a 785 nm monochromatic excitation laser focussed into the object at an angle of 45° to the objects surface to induce Raman emission. The emission spectra is collected by a collection objective focussed on a region several microns away from illuminated spot at an angle of 45° relative to the objects surface. The returning Raman and fluorescence spectra over a Raman shift range of 90cm-1 – 3050 cm-1 is then collected via a VIS-NIR spectrometer at a 4 cm-1 spectral resolution. The system collects data from a 20 µm spot at a working distance of 50 mm. Fine positioning of the laser spot and Raman mapping of a small region can be enabled by mounting the confocal probe onto a motorised XYZ translation stage. A colour microscope is focused on the collection region perpendicular to the objects surface to provide a microscopic image of the collection region used for positioning measurements and recording data collection regions
Output and data types
Dataset/Data package (images, spectra, other)
Impact on object or sample
Noncontact (no physical contact)
Nondestructive (no permanent damage or alteration)
Noninvasive (no physical alteration)
Manufacturer
ISAAC in-house developed instrument
Acquisition areas
small spot
Working distances
Close-range (0.01 - 0.1 m)