Method: HYDRA-X-ray diffraction
Alternative labels
XRD
DRX
DRX
Description
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.
https://en.wikipedia.org/wiki/X-Ray_crystallography
Techniques
X-ray diffraction (xrd)
Type
Analysis method
Version
11/04/2025
Parameters
Type: Anode nature
Unit: none
Value: Copper anode
Type: Current intensity
Unit: µA
Value: 700
Type: Voltage
Unit: kV
Value: 35
Type: Maximum voltage
Unit: kV
Value: 50
Type: Maximum current intensity
Unit: µA
Value: 600
Type: X-Ray tube power
Unit: W
Value: 30
Type: Alignement system
Unit: none
Value: 4 pointing lasers
Type: Detector
Unit: none
Value: high performance hybrid pixel detector (XPAD)
Type: Detector Sensor Material
Unit: none
Value: Silicon
Type: Detector Energy range
Unit: keV
Value: 7 – 35
Type: Detector Pixel size
Unit: μm²
Value: 130x130
Type: Detector Pixel number
Unit: none
Value: 67200 (560x120)
Type: Detector Active area
Unit: cm²
Value: 7.5 x 1.25
Type: Detector Window composition
Unit: none
Value: thin Mylar
Type: Microscope camera field of view
Unit: mm²
Value: 30 x 25
Type: minimum distance of the X-Ray tube from sample plane
Unit: mm
Value: 9
Type: minimum distance of the XRD detector from sample plane
Unit: mm
Value: 20
Type: minimum distance of the Central Detection Head from sample plane
Unit: mm
Value: 16
Type: 2θ angle covered angles
Unit: degree (°)
Value: 19-60
Type: X-ray tube filter
Unit: none
Value: No filter, 500 μm Al, 800 μm Al, 15 μm Ni