SEM-WDS
WDS

The scanning electron microscope (SEM) allows for qualitative and quantitative examination of the composition of a wide variety of materials. A high-resolution and precise method for this is the use of a wavelength dispersive spectrometer (WDS), which allows us to extract elemental composition information from the sample under investigation on a size scale of 0.5-1 µm. The method allows us to perform point measurements, area measurements, line measurements and create elemental maps of the surface of the sample under investigation. The examination is non-destructive. The essence of the WDS method: the atoms of the sample excited by a focused electron beam emit characteristic X-ray radiation in the form of X-ray photons, which radiation has properties characteristic of the given element. This X-ray radiation is projected onto the analyzing crystals of the WDS detector, where it is scattered at the lattice points of the crystal. The scattered rays interfere and strengthen each other at certain angles, which allows us to calculate the unknown wavelength, determine the elemental quality of the given material, and determine the concentration of the given element from the intensity of the radiation. The resolution of the wavelength dispersive X-ray spectrometer (WDS) is defined for the peak of Fe Kα (6.4 keV) to be about 10 eV. It should be noted that the resolution of WDS is much better than that of EDS. Detector type: Bruker Quantax XSense WDS Investigable materials: ceramics, metal objects, plants, bones, textiles, polymers, pigments, glasses, geological materials, industrial materials, etc. Application Examples: - Qualitative and quantitative analysis of elements that cannot or are difficult to separate using EDS (Ag-Sn, Pb-S) - Detection of the spatial distribution of trace elements with micrometer accuracy.

Scanning electron microscopy with thermionic emission gun (sem)

Wavelength Dispersive Spectrometer (WDS)

Elemental Analysis

1.0