The material under examination is excited using X-rays. The characteristic X-ray photons emitted by the material are detected using silicon drift detectors. Based on the data collected, the composition of the material under examination can be determined. Measurements can include point analyses, area scans, line scans, and the creation of element maps of the examined objects. This allows for the determination of the point-specific chemical composition, phase identification, spatial element distribution, and spatial phase distribution of the material, among other properties. Application Examples: Metal objects - Analysis of the composition of various metal objects provides insights into their original material composition, potential corrosion, or patina. - Further data analysis can help determine the origin of the raw materials. - Examination of slag inclusions in metal objects to investigate the device's manufacturing process. Glasses, enamels, and paints - SEM-EDS/WDS identifies the elements responsible for different colors and quantifies their amount. Rocks - Beyond elemental analysis, phase identification can also be performed, and the spatial distribution of various mineral phases can be quantified. This analysis also enables the determination of the rock's modal composition. Ceramics - Analysis of the composition of ceramic objects provides valuable information on the provenance of raw materials (clay and temper) used for potting and on potters’ technological choices.

Micro x-ray fluorescence spectroscopy (μxrf)

Elemental Analysis

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