Imaging and material analysis

The first step in the workflow for the characterization of cultural heritage objects is the imaging. With the 3D digital microscope, the observation, the imaging and the quantitative measurements are possible at the same time. With the stitching function, high resolution picture can be captured from a large area of the surface and this picture can be used as a navigation image for the further investigations. As a next step, the elemental composition is measured by micro-XRF. The measurements give quantitative information about composition. The distribution of elements can also be assessed. The spectrometer is optimized for high-speed analyses of points, lines and 2D area scans (element mapping) of various sample types. It works both in vacuum and in-air, and has a large chamber. The primary X-ray excitation (Rh) uses a polycapillary lens, resulting in small spot sizes and high X-ray intensity. A second X-ray tube (W) extends the analytical capabilities. Several filters are applicable. The device is configured with silicon drift detectors (SDD), offering high throughput without compromising energy resolution. Depending on the sample, electron microscopy can also be applied if we would like to study the surface topography and composition in higher detail. Further information can be gained using a Raman microscope which can be used to obtain information about the type, position and orientation of the functional groups in the molecules of the material. This workflow (or parts of it) can also be used when the elemental analysis is carried out using ion beam analysis. In that case, the ATOMKI IBA service must also be selected.

Micro x-ray fluorescence spectroscopy (μxrf)

digital 3d microcopy, SEM-EDX, Raman

Analysis method

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