The workflow for the characterization of the objects starts with digital 3D imaging. Then, the elemental composition is measured by micro-XRF. The measurements give quantitative information about composition. The distribution of elements can also be assessed. The spectrometer is optimized for high-speed analyses of points, lines and 2D area scans (element mapping) of various sample types. It works both in vacuum and in-air, and has a large chamber. The primary X-ray excitation (Rh) uses a polycapillary lens, resulting in small spot sizes and high X-ray intensity. A second X-ray tube (W) extends the analytical capabilities. The device is configured with silicon drift detectors (SDD), offering high throughput without compromising energy resolution. Depending on the sample, electron microscopy can also be applied. Further information can be gained using a Raman microscope. This workflow (or parts of it) can also be used when the elemental analysis is carried out using ion beam analysis. In that case, the ATOMKI IBA service must also be selected.

Micro x-ray fluorescence spectroscopy (μxrf)

digital 3d microcopy, SEM-EDX, Raman

Analysis method

1.0