The TOF-ND instrument is a general purpose high resolution time-of-flight powder diffractometer. It covers a d-spacing range from 0.5 to 2.5Å (2.5 to 12.5 Å-1 in Q-range) at variable band-with and resolution (d=0.0015–0.15Å). It is applicable for structure determination and refinement, peak profile analyses, phase and texture analyses of solid state materials and for liquid diffraction as well. TOF provides information of the fine phase changes inside the materials, without producing any type of destruction in the sample.

Time-of-flight neutron diffraction

Analysis Method

1.1.